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HX5N0 Series
HX5N0 series fully automatic probe table is a professional comprehensive and efficient fully automatic automatic wafer probe table, with space-saving, high-efficiency features, suitable for 4-inch, 5-inch wafers, including diodes, transistors, MOSFET tubes, photovoltaic devices, sensors, and the vertical structure of the measurement of the chip, can be equipped with an optional multi-needle test function, you can achieve the requirements of the simultaneous measurement of multiple pieces of the machine to increase the capacity of the test.
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HX8N0 Series
HX8N0 series of fully automated probe station equipment professional response to 8-inch wafer-level performance testing of various devices, can be for different wafer testing, can be equipped with the appropriate instrumentation, I-V, C-V, optical signals and other characteristics of the analysis of the equipment feature-rich, can match a variety of test applications, can be upgraded to high-power wafer testing, RF testing, fully automated testing and can be loaded with a temperature-control system, to meet the needs of the customer in a variety of high and low temperature environments. High and low temperature environment of various wafer device performance testing needs.
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HXJ5N0 Series
HXJ5N0 series fully automated probe table 4 inch, 5 inch wafers, including diodes, transistors, MOSFET tubes, optoelectronic devices, sensors and vertical structure of the chip measurement, optional multi-needle test function, can be achieved at the same time more than one of the requirements of the measurement, to improve the test capacity of the machine.
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